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Domínguez-Adame Acosta, Francisco ; Méndez Martín, Bianchi ; Piqueras de Noriega, Javier ; De Diego, N. ; LLopis, J. ; Moser, P. | Editions Physique | 1989-06Positron annihilation (PA) is a sensitive technique for detection of vacancy-type defects in crystals, that has been widely used in recent years to study defects in semiconductors (1). On the other side, CL and other luminescence techniques have[...]texto impreso
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Harris, V. G. ; Das,, B.N. ; Woicik, J. C. ; Crespo del Arco, Patricia ; Hemando, A. ; Garcia Escorial, A. | Editions Physique | 1997-04A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative a[...]
