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Autor Bernabeu Martínez, Eusebio |
Documentos disponibles escritos por este autor (123)
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Peral Cerdá, Assumpta ; Alonso Fernández, José ; Canos Sanz, Joán ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2000-11The warpage of a set of six hard resin spherical lenses was measured when they were compressed by means of the tangential force exerted by a metal frame. The technique employed to measure the lenses improves over previous work both because great[...]texto impreso
Kamal Abd El-Hady, Hala ; Alda, Javier ; Vázquez Moliní, Daniel ; Bernabeu Martínez, Eusebio | Gustav Fischer Verlag | 2004In this paper we analyze different alternatives in the design of optimized optical arrays having spatial integration feature in a plane arrangement. More specifically, we focus our attention in the evaluation of the number of useful individual u[...]texto impreso
Herrera Fenández, José María ; Vilas, José Luis ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | Optical Society of America | 2015-11-20A superachromatic quarter-wave retarder using an arbitrary number of waveplates in a broadband spectral range has been proposed. Their design is based on the optimization of a merit function, the achromatism degree (AcD), which represents a glob[...]texto impreso
Saez Landete, José ; Alonso Fernández, José ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2005-05-30A method to obtain the absolute measure of the position is by means of the autocorrelation of two zero reference marks. In one-axis measurement systems one dimensional mark are used and the design of these marks is relatively complex. When the m[...]texto impreso
Saez Landete, José ; Alonso Fernández, José ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2005-01-10The grating measurement systems can be used for displacement and angle measurements. They require of zero reference codes to obtain zero reference signals and absolute measures. The zero reference signals are obtained from the autocorrelation of[...]texto impreso
Tejeda, César ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2004-03-01We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and[...]texto impreso
Quiroga Mellado, Juan Antonio ; Martínez Antón, Juan Carlos ; Canabal Boutureira, Héctor ; Bernabeu Martínez, Eusebio ; Álvaro Labajo, M. ; Cortés Testillano, V. | SPIE--The International Society for Optical Engineering. | 2001We provide a simple solution for the particular problem of the in-service inspection of aeronautic surfaces in order to detect bumps that otherwise it is made visually and usually less reliably. Bumps and other surface defects can be a symptom o[...]texto impreso
Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2005-06-01In optical metrology the final experimental result is normally an image acquired with a CCD camera. Owing to the sampling at the image, an interpolation is usually required. For determining the error in the measured parameters with that image, k[...]texto impreso
In this paper we present a model to determine the light scattered by a metallic cylinder when it is illuminated with a light beam in oblique incidence. This model is based on an approximate solution to the Helmholtz-Kirchhoff integral by means o[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Gustav Fischer Verlag | 2002We present an analytical model to obtain the diffraction pattern in far field of a metallic, thick slit based on the Geometrical Theory of Diffraction. The edges of the slit are modelled as semicylinders. We have considered that the thickness of[...]texto impreso
Torcal Milla, Francisco José ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2008-11-24We analyze the far field and near field diffraction pattern produced by an amplitude grating whose strips present rough edges. Due to the stochastic nature of the edges a statistical approach is performed. The grating with rough edges is not pur[...]texto impreso
Torcal Milla, Francisco José ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | Elsevier Science BV | 2008-12-01Steel tape gratings are used in different metrology applications. As the period of these gratings was large (around 100?m,), its analytical study has been performed, up to date, using a geometrical approach. Nowadays, steel tape gratings can be [...]texto impreso
Herrera Fernández, José María ; Sánchez Brea, Luis Miguel ; Torcal Milla, Francisco José ; Morlanes Calvo, Tomás ; Bernabeu Martínez, Eusebio | IOP Publishing | 2016-06-14We propose an accurate technique for obtaining highly collimated beams, which also allows testing the collimation degree of a beam. It is based on comparing the period of two different self-images produced by a single diffraction grating. In thi[...]texto impreso
Salgado Remacha, Francisco Javier ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | European Optical Soc | 2011We analyze the effect of the fill factor of binary diffraction gratings on the near field propagation. We show that the location of the best-visibility planes changes with the configuration parameters of the grating, that is, the amplitude and p[...]texto impreso
Kriging is a family of linear methods for the estimation of physical quantities with spatial dependence which are optimal in the squared minima sense. To perform the interpolation, kriging considers, in addition to the value and location of the [...]