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Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2015-01-11A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact o[...]texto impreso
Ramezani, Reza ; Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier | Elsevier | 2020-05-20This paper addresses the problem of hardware tasks reliability estimation in harsh environments. A novel statistical model is presented to estimate the reliability, the mean time to failure, and the number of errors of hardware tasks running on [...]texto impreso
Apuntes de trabajo y exámenes resueltos de la Asignatura Electrónica Analógica, de la desaparecida Ingeniería Superior Electrónica. Asimismo, descripción de los modelos SPICE de los dispositivos electrónicos básicos.texto impreso
Apuntes de trabajo y exámenes resueltos de la Asignatura Electrónica Analógica, de la desaparecida Ingeniería Superior Electrónica. Asimismo, descripción de los modelos SPICE de los dispositivos electrónicos básicos.texto impreso
Lozano Rogado, Jesús ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés | Universidad de La Laguna | 2002-09Se propone en esta comunicación un experimento para facilitar que los alumnos comprendan los principios básicos relacionados con los sensores, circuitos acondicionadores de señal y adquisición de datos con un ordenador. El sistema se basa en un [...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2009-11-12Commercial-off-the-shelf (COTS) capacitor-based isolation amplifiers were irradiated at the Portuguese Research Reactor (PRR) in order to determine its tolerance to the displacement damage and total ionising dose (TID). The set of experimental d[...]texto impreso
Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; López Calle, Isabel ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2014-02-11Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 ? s ) in these devices, which is eventually demonstrated [...]texto impreso
Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; Liu, Shih Fu ; López Calle, Isabel ; Maestro de la Cuerda, Juan Antonio ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having eno[...]texto impreso
Franco Peláez, Francisco Javier ; Lozano Rogado, Jesús ; Santos Blanco, José Pedro ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2003-12Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency beha[...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2007-08-20Power operational amplifiers were irradiated in a mixed neutron and gamma radiation environment. These experiments showed that the degradation of the power operational amplifiers shares a great deal of characteristics with that of the low signal[...]texto impreso
Vegas Azcárate, Ignacio ; Antoranz Canales, Pedro ; Miranda Pantoja, José Miguel ; Franco Peláez, Francisco Javier | Elsevier Science BV | 2017-01-01A variable width pulse generator featuring more than 4-V peak amplitude and less than 10-ns FWHM is described. In this design the width of the pulses is controlled by means of the control signal slope. Thus, a variable transition time control ci[...]texto impreso
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Rezaei, Mohammadreza ; Martín Holgado, Pedro ; Morilla, Yolanda ; Franco Peláez, Francisco Javier ; Fabero Jiménez, Juan Carlos ; Mecha López, Hortensia ; Puchner, Helmut ; Hubert, Guillaume ; Clemente Barreira, Juan Antonio | IEEE-Inst Electrical Electronics Engineers Inc | 2020-10This article presents an experimental study on the sensitivity of a commercial-off-the-shelf (COTS) bulk 65-nm static random access memory (SRAM) under 15.6 MeV proton irradiation when powered up at ultralow bias voltage. Tests were run on stand[...]texto impreso
Velazco, Raoul ; Clemente Barreira, Juan Antonio ; Hubert, Guillaume ; Mansour, Wassim ; Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; Baylac, Maud ; Rey, Solenne ; Rosetto, Olivier ; Villa, Francesca | IEEE-Inst Electrical Electronics Engineers Inc | 2014-12Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell design combining SRAM cells and DRAM capacitors to determine if, as claimed, it is soft-error free and to estimate upper bounds for the cross-section.[...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés ; Casas-Cubillos, Juan ; Rodríguez-Ruiz, Miguel Ángel | IEEE-Inst Electrical Electronics Engineers Inc | 2004-07-22Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related[...]
