Título:
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Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope
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Autores:
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Díaz-Guerra Viejo, Carlos ;
Piqueras de Noriega, Javier
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Tipo de documento:
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texto impreso
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Editorial:
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American Institute of Physics, 1999-08-15
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Física de materiales
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Tipo = Artículo
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Resumen:
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A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques.
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En línea:
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https://eprints.ucm.es/id/eprint/26360/1/PiquerasJ176libre.pdf
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