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Autor Martínez Antón, Juan Carlos |
Documentos disponibles escritos por este autor (28)
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Martínez Antón, Juan Carlos ; Plaza Ortega, Juan Manuel ; Alonso Fernández, José | SPIE | 2013-09-06We present an imaging technique for the 3D-form metrology of optical surfaces. It is based on the optical absorption in fluids situated between the surface and a reference. An improved setup with a bi-chromatic light source is fundamental to obt[...]texto impreso
González Montes, Mario ; Martínez Antón, Juan Carlos ; Vázquez Moliní, Daniel ; Álvarez Fernández Balbuena, Antonio ; Bernabeu Martínez, Eusebio | Hindawi Publishing Corporation | 2014This work is aimed to design and evaluate different achromatic Fresnel lens solutions capable of operating as concentrators aimed at photovoltaic cells systems. Throughout this study, the theoretical parametric design of the achromatic lens will[...]texto impreso
Cuadrado, Alexander ; López-Alonso, José Manuel ; Martínez Antón, Juan Carlos ; Ezquerro Rodríguez, José Miguel ; González, Francisco Javier ; Alda, Javier | SPIE | 2015-08-28Fractal antennas have been proposed to improve the bandwidth of resonant structures and optical antennas. Their multiband characteristics are of interest in radiofrequency and microwave technologies. In this contribution we link the geometry of [...]texto impreso
Quiroga Mellado, Juan Antonio ; Crespo Vázquez, Daniel ; Fournier, N. ; Martínez Antón, Juan Carlos | VDI-VDE - Verlag GMBH | 2004Automatic demodulation of single-image fringe patterns is of great importance in research areas were it is difficult to apply standard phase evaluation techniques such as phase sampling or Fourier transform methods. In this work we will present [...]texto impreso
Bernabeu Martínez, Eusebio ; Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Martínez Antón, Juan Carlos ; Gómez Pedrero, José Antonio ; Wilkening, Günter ; Koenders, Ludger ; Müller, Franz ; Hildebrand, M. ; Hermann, Harti | Elsevier Science B. V. | 2001-08-16In this report a classification of the main surface structures found on fine metallic wires is carried out (between ?20 and 500 ?m in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and producti[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2004-11-15Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical[...]texto impreso
Quiroga Mellado, Juan Antonio ; Martínez Antón, Juan Carlos ; Canabal Boutureira, Héctor ; Bernabeu Martínez, Eusebio ; Álvaro Labajo, M. ; Cortés Testillano, V. | SPIE--The International Society for Optical Engineering. | 2001We provide a simple solution for the particular problem of the in-service inspection of aeronautic surfaces in order to detect bumps that otherwise it is made visually and usually less reliably. Bumps and other surface defects can be a symptom o[...]texto impreso
Cuadrado, Alexander ; López-Alonso, José Manuel ; Martínez Antón, Juan Carlos ; Ezquerro Rodríguez, José Miguel ; González, Francisco Javier ; Alda, Javier | SPIE | 2015-08-28The practical application of optical antennas in detection devices strongly depends on its ability to produce an acceptable signal-to-noise ratio for the given task. It is known that, due to the intrinsic problems arising from its sub-wavelength[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Gustav Fischer Verlag | 2002We present an analytical model to obtain the diffraction pattern in far field of a metallic, thick slit based on the Geometrical Theory of Diffraction. The edges of the slit are modelled as semicylinders. We have considered that the thickness of[...]texto impreso
Quiroga Mellado, Juan Antonio ; Martínez Antón, Juan Carlos ; Canabal Boutureira, Héctor ; Bernabeu Martínez, Eusebio ; Álvaro Labajo, M. ; Cortés Testillano, V. | The Optical Society Of America | 2001-06-01We have extended the use of shadow Moiré technique to be implemented in simple curved surfaces by using a flexible grating. Dynamic visual inspection of surface micro-damages is significantly favored by the use of well adapted pliable gratings c[...]texto impreso
Stretched poly(ethylene-terephthalate) films appear to be an interesting optical plastic for use in polarization control devices. By means of stretching ratios its birefringence, in practice, can be tailored from ?0 to ?0.17. It has a very wide [...]texto impreso
Martínez Antón, Juan Carlos ; Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Gómez Pedrero, José Antonio ; Canabal Boutureira, Héctor ; Bernabeu Martínez, Eusebio | The International Society for Optical Engineering (SPIE) | 2001We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensi[...]texto impreso
García Fernández, Berta ; Vázquez Moliní, Daniel ; Álvarez Fernández-Balbuena, Antonio ; García Botella, Ángel ; Martínez Antón, Juan Carlos | OSA Publishing ; Chinese Laser Press | 2015-09-10Hollow, cylindrical, prismatic light guides (CPLGs) are optical components that, using total internal reflection (TIR), are able to transmit high-diameter light beams in daylight and artificial lighting applications without relevant losses. It i[...]texto impreso
Martínez Antón, Juan Carlos ; Vázquez Moliní, Daniel ; Muñóz de la Luna, Javier ; Gómez Pedrero, José Antonio ; Álvarez Fernández-Balbuena, Antonio | SPIE | 2011-09-21Fresnel lenses and other faceted or micro-optic devices are increasingly used in multiple applications like solar light concentrators and illumination devices, just to name some representative. However, it seems to be a certain lack of adequate [...]texto impreso
Martínez Antón, Juan Carlos ; Serroukh, Ibrahim ; Bernabeu Martínez, Eusebio | Bureau International des Poids et Mesures (BIPM) | 2001Laser diffraction is a robust and precise technique for measuring wire diameters. However, classical Fraunhofer diffraction formulas are inappropriate for determining the size of three-dimensional objects. Babinet's principle (from classical dif[...]