Título:
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Spatial distribution of vacancy defects in GaAs : Te wafers studied by positron annihilation
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Autores:
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Cavallini, A. ;
Dupasquier, A. ;
Ferro, G. ;
Piqueras de Noriega, Javier ;
Valli, M.
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Tipo de documento:
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texto impreso
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Editorial:
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Trans Tech Publications Ltd, 1997
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Física de materiales
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Tipo = Sección de libro
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Resumen:
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The radial vacancy distribution along a LEC-GaAs:Te wafer with an average free carrier concentration n = 1.5 x 10(18) cm(-3) was studied by means of positron lifetime spectroscopy. An M-shaped radial distribution of vacancy-like defects, most probably Te(As)V(Ga)(-), was observed.
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