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Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2015-01-11A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact o[...]texto impreso
Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; López Calle, Isabel ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2014-02-11Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 ? s ) in these devices, which is eventually demonstrated [...]texto impreso
Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; Liu, Shih Fu ; López Calle, Isabel ; Maestro de la Cuerda, Juan Antonio ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having eno[...]texto impreso
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Velazco, Raoul ; Clemente Barreira, Juan Antonio ; Hubert, Guillaume ; Mansour, Wassim ; Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; Baylac, Maud ; Rey, Solenne ; Rosetto, Olivier ; Villa, Francesca | IEEE-Inst Electrical Electronics Engineers Inc | 2014-12Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell design combining SRAM cells and DRAM capacitors to determine if, as claimed, it is soft-error free and to estimate upper bounds for the cross-section.[...]texto impreso
Palomar Trives, Carlos | 2012-06Este proyecto consiste en emular los errores producidos en memorias semiconductoras por la radiación atmosférica mediante un láser pulsado que actúa de modo semejante a un ión. Se realiza un mapa de sensibilidad de la memoria identificando los p[...]texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés ; González Izquierdo, Jesús | IEEE-Inst Electrical Electronics Engineers Inc | 2013-02This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | 2011-09-19Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good c[...]texto impreso
Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; López Calle, Isabel ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2013-08The peak detector effect is a phenomenon that makes single event transients much longer once an error amplifier switches from linear to saturation zone due to the presence of external capacitors. This is so-called since it was discovered in a si[...]texto impreso
Amigo de la Huerga, Ángel ; Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; López Calle, Isabel ; Cervera, María Fe ; Hernández Cachero, Antonio ; Agapito Serrano, Juan Andrés | Escuela Técnica Superior de Ingenieros Industriales. Universidad Politécnica de Madrid | 2013-07-10En esta contribución se explica el diseño, fabricación y verificación experimental de un sistema automático de lectura y escritura de memorias SRAM cuyo objeto es la determinación de la tasa de errores asociados a la acción de los rayos cósmicos[...]texto impreso
Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2015-08-15This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar technology appropriate to simulate single event transients. First of all, we will show how to obtain SPICE models of the internal transistors from texts[...]
