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Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2015-01-11A reliable voltage reference is mandatory in mixed-signal systems. However, this family of components can undergo very long single event transients when operating in radiation environments such as space and nuclear facilities due to the impact o[...]texto impreso
Grassie, Alexander D. C. ; Agapito Serrano, Juan Andrés ; Gonzalez Espeso, Pablo | IOP Publishing | 1979An excess resistivity has been observed in thin film polycrystalline samples of SnTe with low carrier concentration and is attributed to the additional scattering due to the phonon softening associated with the structural phase transition.texto impreso
Lozano Rogado, Jesús ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés | Universidad de La Laguna | 2002-09Se propone en esta comunicación un experimento para facilitar que los alumnos comprendan los principios básicos relacionados con los sensores, circuitos acondicionadores de señal y adquisición de datos con un ordenador. El sistema se basa en un [...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2009-11-12Commercial-off-the-shelf (COTS) capacitor-based isolation amplifiers were irradiated at the Portuguese Research Reactor (PRR) in order to determine its tolerance to the displacement damage and total ionising dose (TID). The set of experimental d[...]texto impreso
Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; López Calle, Isabel ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2014-02-11Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 ? s ) in these devices, which is eventually demonstrated [...]texto impreso
Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; Liu, Shih Fu ; López Calle, Isabel ; Maestro de la Cuerda, Juan Antonio ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having eno[...]texto impreso
Franco Peláez, Francisco Javier ; Lozano Rogado, Jesús ; Santos Blanco, José Pedro ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2003-12Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency beha[...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2007-08-20Power operational amplifiers were irradiated in a mixed neutron and gamma radiation environment. These experiments showed that the degradation of the power operational amplifiers shares a great deal of characteristics with that of the low signal[...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés ; Casas-Cubillos, Juan ; Rodríguez-Ruiz, Miguel Ángel | IEEE-Inst Electrical Electronics Engineers Inc | 2004-07-22Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related[...]texto impreso
Horrillo Guemes, María Carmen ; Gutiérrez Monreal, Javier ; Arés Escolar, Luis ; Robla Villalba, José Ignacio ; Sayago Olmo, Isabel ; Getino González, José ; Agapito Serrano, Juan Andrés | 1994-04-15Hall effect measurement is one of the most powerful methods for obtaining information about transport mechanisms in polycrystalline semiconductor compounds that constitute the basis for understanding the sensing function of semiconductor gas sen[...]texto impreso
Franco Peláez, Francisco Javier ; Zong, Yi ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2006-08-28Radiation tests have shown the existence of inactivity windows in analog switches. It means that the devices lose their ability to switch between ON and OFF states if the total radiation dose is placed between two characteristic values. Once the[...]texto impreso
Agapito Serrano, Juan Andrés ; Barradas, Nuno P. ; Cardeira, Fernando M. ; Casas-Cubillos, Juan ; Fernandes, Ana C. ; Franco Peláez, Francisco Javier ; Gomes, Paulo ; Gonçalves, Isabel C. ; Hernández Cachero, Antonio ; Lozano Rogado, Jesús ; Martin Barreales, Miguel Ángel ; Marques, José G. ; Paz López, Antonio ; Prata, María José ; Ramalho, Antonio J. G. ; Rodríguez-Ruiz, Miguel Ángel ; Santos Blanco, José Pedro ; Vieira, A. | CERN Publishing Service | 2000-12-01Instrumentation amplifiers and voltage controlled current sources have been designed by using single operational amplifiers (OPA124, TLE2071 and OPA627). Their performance has been evaluated in the laboratory and under neutron radiation. On line[...]texto impreso
Jules Horowitz reactor project. Exploration tests concerning WIFI modules behaviour under gamma flux
Gaillot, Stephan ; Pouchin, Bernard ; Marques, José ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Within the framework of experimental field on technologies developments for research reactors applications, an experimental program dedicated to electronics behaviour under flux has been performed on wireless (WIFI) modules. The interest of usin[...]texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés ; González Izquierdo, Jesús | IEEE-Inst Electrical Electronics Engineers Inc | 2013-02This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | 2011-09-19Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good c[...]
