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Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; López Calle, Isabel ; Agapito Serrano, Juan Andrés | Elsevier Science BV | 2014-02-11Shunt linear voltage regulators are still used in situations where other kinds of regulators are not advised. This paper explores a mechanism liable to induce long duration pulses ( ~ 100 ? s ) in these devices, which is eventually demonstrated [...]texto impreso
Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; Liu, Shih Fu ; López Calle, Isabel ; Maestro de la Cuerda, Juan Antonio ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having eno[...]texto impreso
Actualmente, uno de los grandes retos de la industria espacial electrónica es la selección de componentes espaciales capaces de soportar las continuas radiaciones que sufren los componentes electrónicos y que pueden alterar seriamente su comport[...]texto impreso
Jules Horowitz reactor project. Exploration tests concerning WIFI modules behaviour under gamma flux
Gaillot, Stephan ; Pouchin, Bernard ; Marques, José ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2011-09-19Within the framework of experimental field on technologies developments for research reactors applications, an experimental program dedicated to electronics behaviour under flux has been performed on wireless (WIFI) modules. The interest of usin[...]texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés ; González Izquierdo, Jesús | IEEE-Inst Electrical Electronics Engineers Inc | 2013-02This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.texto impreso
Palomar Trives, Carlos ; López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | 2011-09-19Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good c[...]texto impreso
López Calle, Isabel ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés ; González Izquierdo, Jesús | IEEE-Inst Electrical Electronics Engineers Inc | 2011-02-08One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the netwo[...]texto impreso
Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; López Calle, Isabel ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2013-08The peak detector effect is a phenomenon that makes single event transients much longer once an error amplifier switches from linear to saturation zone due to the presence of external capacitors. This is so-called since it was discovered in a si[...]texto impreso
López Calle, Isabel ; González Izquierdo, Jesús ; Franco Peláez, Francisco Javier ; Agapito Serrano, Juan Andrés | s.n. | 2011-07-05En este artículo, se describe un sistema que permite emular por medio de un láser los transitorios que pueden producir los rayos cósmicos en los componentes electrónicos. En particular, el sistema está adaptado para examinar componentes analógic[...]texto impreso
Amigo de la Huerga, Ángel ; Palomar Trives, Carlos ; Franco Peláez, Francisco Javier ; López Calle, Isabel ; Cervera, María Fe ; Hernández Cachero, Antonio ; Agapito Serrano, Juan Andrés | Escuela Técnica Superior de Ingenieros Industriales. Universidad Politécnica de Madrid | 2013-07-10En esta contribución se explica el diseño, fabricación y verificación experimental de un sistema automático de lectura y escritura de memorias SRAM cuyo objeto es la determinación de la tasa de errores asociados a la acción de los rayos cósmicos[...]texto impreso
López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2009-09-14Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
