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Autor Clemente Barreira, Juan Antonio |
Documentos disponibles escritos por este autor (39)
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Hubert, Guillaume ; Aubry, Sébastien ; Clemente Barreira, Juan Antonio | The Institute of Electrical and Electronics Engineers (IEEE) | 2020-03-02This article proposes to study the impact of ground-level enhancement (GLE) induced by extreme solar flares on the soft error rate (SER) for flight representatives to the world-air traffic. A GLE physical model was confronted to cosmic ray varia[...]texto impreso
El HW reconfigurable se puede utilizar para construir un sistema multitarea en el que las tareas puedan asignarse en tiempo de ejecución a los recursos reconfigurables según las necesidades de las aplicaciones. En estos sistemas, las tareas se r[...]texto impreso
Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Mecha López, Hortensia ; Velazco, Raoul | IEEE | 2019-03-01After having carried out radiation experiments on memories, the detected bitflips must be classified into single bit upsets and multiple events to calculate the cross sections of different phenomena. There are some accepted procedures to determi[...]texto impreso
Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Korkian, Golnaz ; Fabero Jiménez, Juan Carlos ; Mecha López, Hortensia ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2020In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estim[...]texto impreso
Este documento es una traducción al inglés del tutorial escrito por Marcos Sánchez-Élez Martín, titulado "Introducción a la programación en VHDL", depositado en E-Prints bajo la URL http://eprints.ucm.es/26200/.texto impreso
Clemente Barreira, Juan Antonio ; Beretta, Ivan ; Rana, Vincenzo ; Atienza, David ; Sciuto, Donatella | ACM | 2014-06-01Reconfigurable platforms are a promising technology that offers an interesting trade-off between flexibility and performance, which many recent embedded system applications demand, especially in fields such as multimedia processing. These applic[...]texto impreso
This paper presents a methodology to emulate Single Event Upsets (SEUs) in FPGA flip-flops (FFs). Since the content of a FF is not modifiable through the FPGA configuration memory bits, a dedicated design is required for fault injection in the F[...]texto impreso
Sáez Alcaide, Juan Carlos ; Sánchez-Elez Martín, Marcos ; Risco Martín, José Luis ; Castro Rodríguez, Fernando ; Prieto Matías, Manuel ; Sáez Puche, Regino ; Chaver Martínez, Daniel ; Olcoz Herrero, Katzalin ; Clemente Barreira, Juan Antonio ; Igual Peña, Francisco ; García García, Adrián ; Sánchez Foces, David | 2018-06-30La internacionalización de la docencia ofrece grandes oportunidades para la Universidad, pero también plantea retos significativos para estudiantes y profesores. En particular, la creación y mantenimiento efectivo del material docente de una as[...]texto impreso
Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Vila, Francesca ; Baylac, Maud ; Ramos Vargas, Pablo Francisco ; Vargas Vallejo, Vanessa Carolina ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2015-09-18This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage of advanced low-power SRAMs by Renesas Electronics. The most interesting results are the occurrence of clusters of bitflips, hard errors only vis[...]texto impreso
La computación reconfigurable es una tecnología prometedora que permite ejecutar con gran eficiencia aplicaciones con una alta carga computacional y/o un comportamiento dinámico difícil o imposible de predecir, a la vez que reutilizar los mismos[...]texto impreso
Botella Juan, Guillermo ; Barrio García, Alberto Antonio Del ; García Sanchez, Carlos ; Clemente Barreira, Juan Antonio ; Bernabé García, Sergio ; Roa Romero, Carlos ; Ahmed Fahmy Amin, Hesham ; Ezquerro Rodríguez, José Miguel ; Cao García, Francisco Javier ; Sierra López, Angel | 2019-08-01Los objetivos alcanzados en el proyecto han sido: I) Continuar la preparación del framework de desarrollo rápido de código VHDL sobre FPGAs de Altera a partir de código Matlab y del entorno gráfico Simulink realizado en el proyecto ALLIANCE (PID[...]texto impreso
Ramezani, Reza ; Sedaghat, Yasser ; Clemente Barreira, Juan Antonio | The Institute of Electrical and Electronics Engineers (IEEE) | 2017-04This study presents a technique to improve the reliability and the Mean Time to Failure (MTTF) of hardware task graphs running on reconfigurable computers. This tech- nique, which has been named Task Early-fetch, can be applied to a sequence of [...]texto impreso
Clemente Barreira, Juan Antonio ; Mozos Muñoz, Daniel ; Resano, Javier | 2011-09-01Dynamically reconfigurable hardware is a promising technology that combines in the same device both the high performance and the flexibility that many recent applications demand. However, one of its main drawbacks is the reconfiguration overhead[...]texto impreso
Clemente Barreira, Juan Antonio ; Hubert, Guillaume ; Franco Peláez, Francisco Javier ; Vila, Francesca ; Baylac, Maud ; Puchner, Helmut ; Velazco, Raoul ; Mecha López, Hortensia | IEEE-Inst Electrical Electronics Engineers Inc | 2017-08-01This paper presents the characterization of the sensitivity to 14-MeV neutrons of a Commercial Off-The-Shelf (COTS) 90-nm Static Random Access Memories (SRAMs) manufactured by Cypress Semiconductor, when biased at ultra low voltage. Firstly, exp[...]texto impreso
Clemente Barreira, Juan Antonio ; Hubert, Guilaume ; Fraire, Juan ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Rey, Solenne ; Baylac, Maud ; Puchner, Helmut ; Mecha, Hortensia ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2018-02-01This paper presents a SEU sensitivity characterization at ultra-low bias voltage of three generations of COTS SRAMs manufactured in 130 nm, 90 nm and 65 nm CMOS processes. For this purpose, radiation tests with 14.2 MeV neutrons were performed f[...]