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Rams, J. ; Méndez Martín, Bianchi ; Craciun, G. ; Plugaru, R. ; Piqueras de Noriega, Javier | Amer Inst Physics | 1999-03-22An increase of the cathodoluminescence (CL) signal of porous silicon (PS) cracked in vacuum of up to three orders of magnitude has been achieved. Under high electron-beam currents, the samples cracked in interconnected pieces of tens of microns,[...]texto impreso
Plugaru, R. ; Craciun, G. ; Nastase, N. ; Méndez Martín, Bianchi ; Cremades Rodríguez, Ana Isabel ; Piqueras de Noriega, Javier ; Nogales Díaz, Emilio | Kluwer Academic Publishers | 2000-01Luminescence emission of LPCVD polycrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show visible luminescence with dominant blue band. The relative intensity of blue e[...]texto impreso
Cathodoluminescence of porous silicon after mechanical damage with a tip has been studied in the scanning electron microscope. Mechanical damage results in the exposure of new surfaces related to fracture and to small particles appearing over th[...]texto impreso
Piqueras de Noriega, Javier ; Méndez Martín, Bianchi ; Plugaru, R. ; Craciun, G. ; Garcia, J. A. ; Remon, A. | Springer | 1999-03Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show a dominant band at 400 nm as well as a band centered at about 650 nm. CL spectra of [...]texto impreso
Nogales Díaz, Emilio ; Méndez Martín, Bianchi ; Piqueras de Noriega, Javier ; Plugaru, R. | Materials Research Society | 2003Electrically active regions of nanocrystalline silicon (nc-Si) films as well as of a p-type crystalline silicon (c-Si) wafer have been investigated by using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrume[...]texto impreso
Plugaru, R. ; Méndez Martín, Bianchi ; Piqueras de Noriega, Javier ; Tate, T.J. | Institute of Physics | 2002-12-16Visible luminescence of amorphous silicon layers either implanted with Er or co-implanted with Er and O and subsequently annealed in nitrogen has been investigated by cathodoluminescence (CL) in a scanning electron microscope. Co-implanted sampl[...]texto impreso
Plugaru, R. ; Vasilco, R. ; Piqueras de Noriega, Javier ; Cremades Rodríguez, Ana Isabel | IEEE | 2003Polyerystalline TiO2 surface reconstruction in oxygen atmosphere has been investigated by atomic force microscopy (AFM) and cathodoluminescence in the scanning electron microscopy (SEM-CL). The reactivity to oxygen is related to the presence of [...]
