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Título:
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Scanning tunneling spectroscopy study of silicon and platinum assemblies in an opal matrix
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Autores:
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Díaz-Guerra Viejo, Carlos ;
Piqueras de Noriega, Javier ;
Golubev, VG. ;
Kurdyukov, D.A. ;
Pevtsov, A. B. ;
Zamoryanskaya, M. V.
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Tipo de documento:
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texto impreso
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Editorial:
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Amer Inst Physics, 2002-11-13
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Física de materiales
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Tipo = Artículo
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Resumen:
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Scanning tunneling microscopy and scanning tunneling spectroscopy (STS) are used to investigate the local electronic behavior of Pt-Si nanostructures fabricated in an opal matrix formed by silica spheres of 250 nm diameter. Si and Pt are regularly distributed inside the opal pores and form nanoscale metal-semiconductor-metal junctions. Normalized differential conductance curves enable us to study the distribution of Pt and Si and to detect the presence of regions showing a surface band gap in the range 0.5-0.8 eV, possibly associated with the formation of silicides. STS appears as a suitable technique for the electrical characterization of opal-based nanostructures.
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En línea:
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https://eprints.ucm.es/id/eprint/26341/1/PiquerasJ161libre.pdf
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