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IEEE-Inst Electrical Electronics Engineers Inc |
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Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2015-08-15This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar technology appropriate to simulate single event transients. First of all, we will show how to obtain SPICE models of the internal transistors from texts[...]texto impreso
Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Rey, Sole ; Baylac, Maud ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Puchner, Helmut ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2015-09-18This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.texto impreso
Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Baylac, Maud ; Rey, Solenne ; Villa, Francesca ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Puchner, Helmut ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2017-08-01This paper addresses a well-known problem that occurs when memories are exposed to radiation: the determination if a bitflip is isolated or if it belongs to a multiple event. As it is unusual to know the physical layout of the memory, this paper[...]texto impreso
Crocco, J. ; Bensalah, H. ; Zheng, Q. ; Dierre, F. ; Hidalgo Alcalde, Pedro ; Carrascal, J. ; Vela, O. ; Piqueras de Noriega, Javier ; Dieguez, E. | IEEE-Inst Electrical Electronics Engineers Inc | 2011-08The Vertical Gradient Freeze (VGF) method has been used to grow high resistivity Cadmium Zinc Telluride (CZT) for high energy radiation applications. In this work, the effect of lapping and polishing the lateral edges of planar detectors is stud[...]texto impreso
López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2009-09-14Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.