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IEEE-Inst Electrical Electronics Engineers Inc |
Documentos disponibles de esta editorial (35)
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Clemente Barreira, Juan Antonio ; Hubert, Guillaume ; Franco Peláez, Francisco Javier ; Vila, Francesca ; Baylac, Maud ; Puchner, Helmut ; Velazco, Raoul ; Mecha López, Hortensia | IEEE-Inst Electrical Electronics Engineers Inc | 2017-08-01This paper presents the characterization of the sensitivity to 14-MeV neutrons of a Commercial Off-The-Shelf (COTS) 90-nm Static Random Access Memories (SRAMs) manufactured by Cypress Semiconductor, when biased at ultra low voltage. Firstly, exp[...]![]()
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Clemente Barreira, Juan Antonio ; Hubert, Guilaume ; Fraire, Juan ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Rey, Solenne ; Baylac, Maud ; Puchner, Helmut ; Mecha, Hortensia ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2018-02-01This paper presents a SEU sensitivity characterization at ultra-low bias voltage of three generations of COTS SRAMs manufactured in 130 nm, 90 nm and 65 nm CMOS processes. For this purpose, radiation tests with 14.2 MeV neutrons were performed f[...]![]()
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Fabero Jiménez, Juan Carlos ; Mecha López, Hortensia ; Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Korkian, Golnaz ; Rey, Solenne ; Cheymol, Benjamin ; Baylac, Maud ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2020A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and [...]![]()
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Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Baylac, Maud ; Ramos Vargas, Pablo Francisco ; Vargas Vallejo, Vanessa Carolina ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2016-08-16This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low Power SRAMs (A-LPSRAM) at low bias voltage little above the threshold value that allows the retention of data. This family of memories is characteri[...]![]()
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Amo, Ana del ; Montero, Javier ; Fernández, Angela ; López, Marina ; Tordesillas, José Manuel ; Biging, Greg | IEEE-Inst Electrical Electronics Engineers Inc | 2002Geographical information (including remotely sensed data) is usually imprecise, meaning that the boundaries between different phenomena are fuzzy. In fact, many classes in nature show internal gradual differences in species, health, age, moistur[...]![]()
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Franco Peláez, Francisco Javier ; Palomar Trives, Carlos ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2015-08-15This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar technology appropriate to simulate single event transients. First of all, we will show how to obtain SPICE models of the internal transistors from texts[...]![]()
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Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Rey, Sole ; Baylac, Maud ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Puchner, Helmut ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2015-09-18This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.![]()
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Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Baylac, Maud ; Rey, Solenne ; Villa, Francesca ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Puchner, Helmut ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2017-08-01This paper addresses a well-known problem that occurs when memories are exposed to radiation: the determination if a bitflip is isolated or if it belongs to a multiple event. As it is unusual to know the physical layout of the memory, this paper[...]![]()
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Crocco, J. ; Bensalah, H. ; Zheng, Q. ; Dierre, F. ; Hidalgo Alcalde, Pedro ; Carrascal, J. ; Vela, O. ; Piqueras de Noriega, Javier ; Dieguez, E. | IEEE-Inst Electrical Electronics Engineers Inc | 2011-08The Vertical Gradient Freeze (VGF) method has been used to grow high resistivity Cadmium Zinc Telluride (CZT) for high energy radiation applications. In this work, the effect of lapping and polishing the lateral edges of planar detectors is stud[...]![]()
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López Calle, Isabel ; Franco Peláez, Francisco Javier ; González Izquierdo, Jesús ; Agapito Serrano, Juan Andrés | IEEE-Inst Electrical Electronics Engineers Inc | 2009-09-14Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.