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Título:
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Complete characterization of arbitrary quantum measurement processes
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Autores:
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Luis Aina, Alfredo ;
Sánchez Soto, Luis Lorenzo
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Tipo de documento:
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texto impreso
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Editorial:
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American Physical Society, 1999-11-01
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Optica
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Tipo = Artículo
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Resumen:
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We examine two simple and feasible practical schemes allowing the complete determination of any quantum measuring arrangement. This is illustrated with the example of parity measurement.
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En línea:
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https://eprints.ucm.es/id/eprint/32455/1/Luis%2CA107libre.pdf
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