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Bernabeu Martínez, Eusebio ; Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Martínez Antón, Juan Carlos ; Gómez Pedrero, José Antonio ; Wilkening, Günter ; Koenders, Ludger ; Müller, Franz ; Hildebrand, M. ; Hermann, Harti | Elsevier Science B. V. | 2001-08-16In this report a classification of the main surface structures found on fine metallic wires is carried out (between ?20 and 500 ?m in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and producti[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2004-11-15Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical[...]texto impreso
En la presente Memoria de Tesis Doctoral presentamos por un lado, un estudio de las causas más probables por las que aparecen los defectos encontrados en la superficie de hilos metálicos finos, del orden de 30 a 600 micras de diámetro, y una cat[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Gustav Fischer Verlag | 2002We present an analytical model to obtain the diffraction pattern in far field of a metallic, thick slit based on the Geometrical Theory of Diffraction. The edges of the slit are modelled as semicylinders. We have considered that the thickness of[...]texto impreso
Martínez Antón, Juan Carlos ; Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Gómez Pedrero, José Antonio ; Canabal Boutureira, Héctor ; Bernabeu Martínez, Eusebio | The International Society for Optical Engineering (SPIE) | 2001We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensi[...]texto impreso
Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Rebollo, María Aurora ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2000-02-01In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) tha[...]texto impreso
Siegmann, Philip ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Elsevier Sci. Ltd. | 2004-08The quality of the surface of metallic wires is relevant for different applications. The reflection of a laser beam on the surface of a metallic cylindrical wire provides an efficient way to inspect the quality of its surface. Our interest is fo[...]
