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Gálvez Alonso, Fernando ; Monton, C. ; Serrano, A., A. ; Valmianski, I. ; De la Venta, J. ; Schuller, Ivan K. ; García, M. A. | Elsevier Science S A | 2012-09We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also o[...]texto impreso
Navarro Palma, Elena ; Monton, C. ; Pereiro, J. ; Basaran, Ali C. ; Schuller, Ivan K. | American Physical Society | 2015-09-21We present a comparative study of vortex pinning efficiency in superconducting (V) thin films grown on two similar triangular arrays of superconducting (Nb) and nonsuperconducting (Cu) nanodots. Resistance and magnetization anomalies at the same[...]texto impreso
Serrano, A. ; Monton, C. ; Valmianski, I. ; Gálvez Alonso, Fernando ; Cortajarena, Aitziber L. ; De la Venta, J. ; Schuller, Ivan K. ; García, M. A. | American Institute of Physics | 2014-03-14We present a Surface Plasmon Resonance spectroscopy study of Co-Phthalocyanine (CoPc) thin films grown on Au layers at different substrate temperatures. We demonstrate that for quantitative analysis, fitting of the resonance angle alone is insuf[...]
