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Gálvez Alonso, Fernando ; Monton, C. ; Serrano, A., A. ; Valmianski, I. ; De la Venta, J. ; Schuller, Ivan K. ; García, M. A. | Elsevier Science S A | 2012-09We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also o[...]texto impreso
Serrano, A. ; Monton, C. ; Valmianski, I. ; Gálvez Alonso, Fernando ; Cortajarena, Aitziber L. ; De la Venta, J. ; Schuller, Ivan K. ; García, M. A. | American Institute of Physics | 2014-03-14We present a Surface Plasmon Resonance spectroscopy study of Co-Phthalocyanine (CoPc) thin films grown on Au layers at different substrate temperatures. We demonstrate that for quantitative analysis, fitting of the resonance angle alone is insuf[...]
