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Automatic demodulation of single-image fringe patterns with application in the evaluation of external defects in aeronautical surfaces by shadow-moire

Quiroga Mellado, Juan Antonio ; Crespo Vázquez, Daniel ; Fournier, N. ; Martínez Antón, Juan Carlos | VDI-VDE - Verlag GMBH | 2004

Automatic demodulation of single-image fringe patterns is of great importance in research areas were it is difficult to apply standard phase evaluation techniques such as phase sampling or Fourier transform methods. In this work we will present [...]

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