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Título:
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Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
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Autores:
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Morlanes Calvo, Tomás ;
Peña, José Luis de la ;
Sánchez Brea, Luis Miguel ;
Alonso Fernández, José ;
Crespo Vázquez, Daniel ;
Saez Landete, José ;
Bernabeu Martínez, Eusebio
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Tipo de documento:
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texto impreso
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Editorial:
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Society of Photo-Optical Instrumentation Engineers (SPIE), 2005
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Optica
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Tipo = Sección de libro
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Resumen:
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In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.
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