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Título:
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In-plane impedance spectroscopy in aerosol deposited NiMn_(2)O_(4) negative temperature coefficient thermistor films
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Autores:
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Ryu, Jungho ;
Park, Dong-Soo ;
Schmidt, Rainer
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Tipo de documento:
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texto impreso
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Editorial:
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American Institute of Physics, 2011-06-01
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electricidad
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Materia = Ciencias: Física: Electrónica
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Tipo = Artículo
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Resumen:
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Temperature dependent in-plane impedance spectroscopy measurements were carried out in order to analyze the charge transport properties of functional oxide NiMn_(2)O_(4) negative temperature coefficient thermistor films deposited via aerosol deposition techniques onto glass and Al_(2)O_(3) substrates. The in-plane resistivity (?) versus temperature (T) curves of all films were uniform over a large temperature range (180 K to 500 K) and showed the typical exponential power-law behavior associated with variable-range hopping. The ?-T dependences of annealed and as-deposited films exhibited power-law exponents ? of about 0.6 and thermistor constants B in the range of 3500 K to 5000 K. As-deposited films showed higher ? values as compared to annealed films. As-deposited films exhibited also increased B values, leading to increased sensitivity of the resistance to temperature changes, whereas annealed films deposited on Al_(2)O_(3) showed the lowest scatter in differentiated ?-T data and might display superior reliability for temperature sensing applications.
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En línea:
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https://eprints.ucm.es/id/eprint/32556/1/Schmidt04.libre.pdf
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