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Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

Morlanes Calvo, Tomás ; Peña, José Luis de la ; Sánchez Brea, Luis Miguel ; Alonso Fernández, José ; Crespo Vázquez, Daniel ; Saez Landete, José ; Bernabeu Martínez, Eusebio | Society of Photo-Optical Instrumentation Engineers (SPIE) | 2005

In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement [...]

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