Información del autor
Autor Schmid, Ulrich |
Documentos disponibles escritos por este autor (1)
![](./images/expand_all.gif)
![](./images/collapse_all.gif)
![Selecciones disponibles](./images/orderby_az.gif)
![]()
texto impreso
Schmidt, Rainer ; Mayrhofer, Patrick ; Schmid, Ulrich ; Bittner, Achim | American Institute of Physics | 2019-02-26In this work, a comprehensive characterization of metal-insulator-semiconductor structures by impedance spectroscopy is demonstrated for the case of electrically insulating, highly c-axis oriented, 600 nm sputter-deposited AlN films on n-Si subs[...]