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Título:
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Neutron-Induced single events in a COTS soft-error free SRAM at low bias voltage
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Autores:
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Clemente Barreira, Juan Antonio ;
Franco Peláez, Francisco Javier ;
Vila, Francesca ;
Baylac, Maud ;
Ramos Vargas, Pablo Francisco ;
Vargas Vallejo, Vanessa Carolina ;
Mecha López, Hortensia ;
Agapito Serrano, Juan Andrés ;
Velazco, Raoul
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2015-09-18
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Radiactividad
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Materia = Ciencias: Informática: Circuitos integrados
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Tipo = Sección de libro
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Resumen:
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This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage of advanced low-power SRAMs by Renesas Electronics. The most interesting results are the occurrence of clusters of bitflips, hard errors only visible at low voltage, appearing along with single event upsets. The physical mechanisms are briefly discussed.
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En línea:
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https://eprints.ucm.es/34157/1/RADECS2015-168.pdf
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