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Título:
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Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques
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Autores:
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Miranda Pantoja, José Miguel ;
Muñoz San Martín, Sagrario ;
Sebastián Franco, José Luis
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE, 2001
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electricidad
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Materia = Ciencias: Física: Electrónica
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Tipo = Sección de libro
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Resumen:
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This paper presents a procedure for an accurate characterization of parasitic effects of terminal pads in microwave devices. This procedure is based on the measurement of S and Noise parameters of the device with two different sets of calibration standards, and simplifies the process of extracting the parasitic elements of the small signal equivalent circuit.
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En línea:
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https://eprints.ucm.es/id/eprint/24670/1/MirandaJM99.pdf
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