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Ramos, Pablo ; Vargas Vallejo, Vanessa Carolina ; Baylac, Maud ; Villa, Francesca ; Rey, Solenne ; Clemente Barreira, Juan Antonio ; Zergainoh, Nacer-Eddine ; Méhaut, Jean-François | IEEE | 2016-08The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented ECC and parity in their cache memories. Two different application scenarios are studied. The first one configures the multi-core in Asymmetric M[...]texto impreso
Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Vila, Francesca ; Baylac, Maud ; Ramos Vargas, Pablo Francisco ; Vargas Vallejo, Vanessa Carolina ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2015-09-18This paper presents an experimental study of the sensitivity to 15-MeV neutrons at low bias voltage of advanced low-power SRAMs by Renesas Electronics. The most interesting results are the occurrence of clusters of bitflips, hard errors only vis[...]texto impreso
Clemente Barreira, Juan Antonio ; Franco Peláez, Francisco Javier ; Villa, Francesca ; Baylac, Maud ; Ramos Vargas, Pablo Francisco ; Vargas Vallejo, Vanessa Carolina ; Mecha López, Hortensia ; Agapito Serrano, Juan Andrés ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2016-08-16This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low Power SRAMs (A-LPSRAM) at low bias voltage little above the threshold value that allows the retention of data. This family of memories is characteri[...]
