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Título:
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Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
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Autores:
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Clemente Barreira, Juan Antonio ;
Franco Peláez, Francisco Javier ;
Villa, Francesca ;
Rey, Sole ;
Baylac, Maud ;
Mecha López, Hortensia ;
Agapito Serrano, Juan Andrés ;
Puchner, Helmut ;
Hubert, Guillaume ;
Velazco, Raoul
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2015-09-18
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Radiactividad
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Materia = Ciencias: Informática: Circuitos integrados
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Tipo = Sección de libro
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Resumen:
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This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
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En línea:
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https://eprints.ucm.es/34217/7/RADECS2015-167-UCMEPrints.pdf
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