Información del autor
Autor Lo Nigro, Raffaella |
Documentos disponibles escritos por este autor (1)
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texto impreso
Fiorenza, Patrick ; Lo Nigro, Raffaella ; Raineri, Vito ; Schmidt, Rainer ; Sinclair, Derek | IOP Publishing | 2010Scanning probe microscopy (SPM) with conductive tips has been used to image the dielectric properties of ceramics with giant permittivity. In particular, measurements in impedance mode of local resistivity allowed to image the permittivity map o[...]