| Título: | Study of point defects in CdTe and CdTe:V by cathodoluminescence | 
																
																																		
																																		
																																	
																																																				
																																						
												| Autores: | Pal, U.																																							 ; 
																				Piqueras de Noriega, Javier																																							 ; 
																				Fernández Sánchez, Paloma																																							 ; 
																				Serrano, M. D.																																							 ; 
																				Dieguez, E. | 
																																											
																											
											| Tipo de documento: | texto impreso | 
																									
																																	
																
																											
											| Editorial: | American Institute of Physics, 1994-09-15 | 
																									
																																	
																
																																	
																																	
																																	
																																	
																											
											| Dimensiones: | application/pdf | 
																									
																																	
																											
											| Nota general: | info:eu-repo/semantics/openAccess | 
																									
																											
											| Idiomas: |  | 
																									
																																	
																																	
																																	
																																	
																											
											| Palabras clave: | Estado = Publicado  
																																							,
																										 Materia = Ciencias: Física: Física de materiales  
																																							,
																										 Tipo = Artículo | 
																									
																											
											| Resumen: | Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands. | 
																									
																																	
																																	
																											   
										   		| En línea: | https://eprints.ucm.es/id/eprint/26974/1/PiquerasJ250libre.pdf |