Información del autor
Autor Patiño, Edgar J. |
Documentos disponibles escritos por este autor (1)
![](./images/expand_all.gif)
![](./images/collapse_all.gif)
![Selecciones disponibles](./images/orderby_az.gif)
![]()
texto impreso
Ramírez, J. G. ; Schmidt, Rainer ; Sharoni, A. ; Gómez, M. E. ; Schuller, Ivan K. ; Patiño, Edgar J. | American Institute of Physics | 2013-02-11Temperature dependent dielectric spectroscopy measurements on vanadium dioxide thin films allow us to distinguish between the resistive, capacitive, and inductive contributions to the impedance across the metal-insulator transition (MIT). We dev[...]