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Título:
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Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
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Autores:
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López Calle, Isabel ;
Franco Peláez, Francisco Javier ;
Agapito Serrano, Juan Andrés ;
González Izquierdo, Jesús
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2011-02-08
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Optica
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Materia = Ciencias: Informática: Circuitos integrados
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Tipo = Sección de libro
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Resumen:
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One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.
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En línea:
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https://eprints.ucm.es/id/eprint/29155/1/CDE2011-LopCa-UCM.pdf
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