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Rams, J. ; Méndez Martín, Bianchi ; Craciun, G. ; Plugaru, R. ; Piqueras de Noriega, Javier | Amer Inst Physics | 1999-03-22An increase of the cathodoluminescence (CL) signal of porous silicon (PS) cracked in vacuum of up to three orders of magnitude has been achieved. Under high electron-beam currents, the samples cracked in interconnected pieces of tens of microns,[...]texto impreso
Plugaru, R. ; Craciun, G. ; Nastase, N. ; Méndez Martín, Bianchi ; Cremades Rodríguez, Ana Isabel ; Piqueras de Noriega, Javier ; Nogales Díaz, Emilio | Kluwer Academic Publishers | 2000-01Luminescence emission of LPCVD polycrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show visible luminescence with dominant blue band. The relative intensity of blue e[...]texto impreso
Piqueras de Noriega, Javier ; Méndez Martín, Bianchi ; Plugaru, R. ; Craciun, G. ; Garcia, J. A. ; Remon, A. | Springer | 1999-03Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As-deposited films show a dominant band at 400 nm as well as a band centered at about 650 nm. CL spectra of [...]texto impreso
Méndez Martín, Bianchi ; Piqueras de Noriega, Javier ; Plugaru, R ; Craciun, G. ; Nastase, N. ; Cremades Rodríguez, Ana Isabel ; Nogales Díaz, Emilio | Trans Tech-Scitec Publications LTD | 1998Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As deposited films show visible luminescence with dominant blue band as well as a red band. The evolution of[...]
