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Título:
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Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates
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Autores:
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Lucía Mulas, María Luisa ;
Sánchez Quesada, Francisco
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Tipo de documento:
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texto impreso
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Editorial:
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American Physical Society, 2006-07
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electricidad
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Materia = Ciencias: Física: Electrónica
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Tipo = Artículo
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Resumen:
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We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.
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En línea:
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https://eprints.ucm.es/id/eprint/27332/1/Lucia%2CML17libre.pdf
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