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Título:
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Laser induced single events in SRAMs
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Autores:
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Palomar Trives, Carlos ;
López Calle, Isabel ;
Franco Peláez, Francisco Javier ;
Agapito Serrano, Juan Andrés ;
González Izquierdo, Jesús
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2013-02
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Optica
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Materia = Ciencias: Informática: Circuitos integrados
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Tipo = Sección de libro
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Resumen:
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This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.
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En línea:
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https://eprints.ucm.es/id/eprint/29179/1/eprintsucm29179.pdf
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