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Título:
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
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Autores:
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Franco Peláez, Francisco Javier ;
Clemente Barreira, Juan Antonio ;
Korkian, Golnaz ;
Fabero Jiménez, Juan Carlos ;
Mecha López, Hortensia ;
Velazco, Raoul
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2020
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Dimensiones:
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application/pdf
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Nota general:
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cc_by_sa
info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = En prensa
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Radiactividad
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Materia = Ciencias: Informática: Circuitos integrados
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Materia = Ciencias: Informática: Electrónica
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Tipo = Artículo
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Resumen:
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In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estimate the accuracy of the experimental results. In this paper, simple formulae are proposed to determine the expected number of false 2-bit and 3-bit MCUs from the number of bitflips, memory size and the method used to search multiple events. These expressions are validated using Monte Carlo simulations and experimental data. Also, a technique is proposed to refine experimental data and thus partially removing possible false events. Finally, it is demonstrated that there is a physical limit to determine the cross section of memories with arbitrary accuracy from a single experiment.
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En línea:
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https://eprints.ucm.es/59495/1/Franco-InherentUncertainty.pdf
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