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Título:
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Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode
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Autores:
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Fabero Jiménez, Juan Carlos ;
Mecha López, Hortensia ;
Franco Peláez, Francisco Javier ;
Clemente Barreira, Juan Antonio ;
Korkian, Golnaz ;
Rey, Solenne ;
Cheymol, Benjamin ;
Baylac, Maud ;
Hubert, Guillaume ;
Velazco, Raoul
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Tipo de documento:
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texto impreso
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Editorial:
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IEEE-Inst Electrical Electronics Engineers Inc, 2020
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Dimensiones:
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application/pdf
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Nota general:
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cc_by_sa
info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = En prensa
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Radiactividad
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Materia = Ciencias: Informática: Circuitos integrados
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Materia = Ciencias: Informática: Electrónica
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Tipo = Artículo
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Resumen:
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A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, BRAM, or flip-flops. SBUs and MCUs with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUSCA SEP3 was used to make assesment for actual environments and an improvement of SEU injection test is proposed.
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En línea:
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https://eprints.ucm.es/59496/1/TNS_Fabero2020_Eprints_UCM.pdf
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