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Optical technique for the automatic detection and measurement of surface defects on thin metallic wires

Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Rebollo, María Aurora ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2000-02-01

In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) tha[...]

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