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Título:
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Using optimization techniques to characterize irradiated CMOS analog switches
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Autores:
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Zong, Yi ;
Franco Peláez, Francisco Javier ;
Agapito Serrano, Juan Andrés
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Tipo de documento:
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texto impreso
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Editorial:
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INTA, 2004-09-22
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Dimensiones:
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application/pdf
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Nota general:
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info:eu-repo/semantics/openAccess
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Idiomas:
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Palabras clave:
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Estado = Publicado
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Materia = Ciencias: Física: Electrónica
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Materia = Ciencias: Física: Radiactividad
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Tipo = Sección de libro
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Resumen:
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The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.
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En línea:
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https://eprints.ucm.es/id/eprint/29022/1/RADECS04-Zong.pdf
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